Print Email Facebook Twitter Single emitter localization analysis in the presence of background Title Single emitter localization analysis in the presence of background Author Stallinga, S. Faculty Applied Sciences Department ImPhys/Imaging Physics Date 2015-09-23 Abstract Localization microscopy for imaging at the nano-scale relies on the quality of fitting the emitter positions from the measured light spots. The type and magnitude of the noise in the detection process, the background light level and the Point Spread Function model that is used in the fit are of paramount importance for the precision and accuracy of the fit. We present several developments on the computational methods and performance limits of single emitter localization, targeting specifically these three aspects. Subject localization microscopysingle moleculemaximum likelihood estimationCramer Rao lower boundbackground To reference this document use: http://resolver.tudelft.nl/uuid:c4ba486f-8948-44c9-8bc9-b9177147a0f1 Publisher SPIE ISBN 9781628418194 Source https://doi.org/10.1117/12.2192043 Source Optical Systems Design 2015: Computational Optics: Proceedings of SPIE- International Society for Optical Engineering; 9630 Part of collection Institutional Repository Document type conference paper Rights © 2015 SPIE Files PDF 323778.pdf 145.92 KB Close viewer /islandora/object/uuid:c4ba486f-8948-44c9-8bc9-b9177147a0f1/datastream/OBJ/view