Print Email Facebook Twitter A CMOS temperature sensor with a voltage-calibrated inaccuracy of ±0.15°C (3σ) from -55 to 125°C Title A CMOS temperature sensor with a voltage-calibrated inaccuracy of ±0.15°C (3σ) from -55 to 125°C Author Souri, K. (TU Delft Electronic Instrumentation) Chae, Y. (TU Delft Electronic Instrumentation) Makinwa, K.A.A. (TU Delft Electronic Instrumentation) Contributor Fujino, L (editor) Date 2012 Abstract This paper describes an energy-efficient CMOS temperature sensor intended for use in RFID tags. The sensor achieves an inaccuracy of ±0.15°C (3σ) over the military temperature range (-55 to 125°C) and dissipates only 27nJ/conversion: over 20× less than a previous sensor with comparable accuracy and resolution [2]. This energy efficiency is achieved by the use of an improved charge-balancing scheme and a zoom ADC that combines a 5b coarse SAR conversion with a 10b fine 2 nd -order ΔΣ conversion. Subject Temperature sensorsCalibrationEnergy efficiencyCapacitorsTemperature measurementEnergy resolution To reference this document use: http://resolver.tudelft.nl/uuid:d452e5d3-355e-4a4c-809e-522989db4640 DOI https://doi.org/10.1109/ISSCC.2012.6176978 Publisher IEEE Society, Piscataway, NJ ISBN 978-1-4673-0377-4 Source Digest of Technical Papers 2012 IEEE International Solid-state Circuits Conference Event ISSCC 2012, San Francisco, California, 2012-02-19 → 2012-02-23, Piscataway, NJ, USA Bibliographical note Accepted author manuscript Part of collection Institutional Repository Document type conference paper Rights © 2012 K. Souri, Y. Chae, K.A.A. Makinwa Files PDF 2193538_MO117_Verification.pdf 1.13 MB Close viewer /islandora/object/uuid:d452e5d3-355e-4a4c-809e-522989db4640/datastream/OBJ/view