Print Email Facebook Twitter Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing Title Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing Author Cai, Miao (Guilin University of Electronic Technology) Yang, Daoguo (Guilin University of Electronic Technology) Huang, J. (TU Delft Electronic Components, Technology and Materials) Zhang, Maofen (Guilin University of Electronic Technology) Chen, Xianping (Chongqing University) Liang, Caihang (Guilin University of Electronic Technology) Koh, S.W. (TU Delft Electronic Components, Technology and Materials) Zhang, Kouchi (TU Delft Electronic Components, Technology and Materials; Chinese Academy of Sciences) Date 2017 Abstract The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model is proposed as the statistical model of the color shift (CS) process of LED products. Consequently, a CS mechanism constant is obtained for detecting the consistency of CS mechanisms among various stress-loaded conditions. A statistical procedure with the proposed power model is then derived for the CS paths of LED lamps in step-loaded stress testing. Two types of commercial LED lamps with different capabilities of heat dissipation (CHDs) are investigated. Results show that the color coordinates of lamps are easily modified in various stress-loaded conditions, and different CHDs of lamps may play a crucial role in the various CS processes. Furthermore, the proposed statistic power model is adequate for the CS process of LED lamps. The consistency of CS mechanisms in step-loaded stress testing can also be detected effectively by applying the proposed statistic procedure with the power model. Moreover, the constant assumption in the model is useful for judging the consistency of CS mechanisms under various stress-loaded conditions. Subject color shift (CS)degradation mechanismLight-emitting diodes (LEDs)reliability modeling To reference this document use: http://resolver.tudelft.nl/uuid:dcf0d64c-e4f2-4e93-9a5a-939a4270776e DOI https://doi.org/10.1109/JPHOT.2016.2634702 ISSN 1943-0655 Source IEEE Photonics Journal, 9 (1) Part of collection Institutional Repository Document type journal article Rights © 2017 Miao Cai, Daoguo Yang, J. Huang, Maofen Zhang, Xianping Chen, Caihang Liang, S.W. Koh, Kouchi Zhang Files PDF 07765031.pdf 1.08 MB Close viewer /islandora/object/uuid:dcf0d64c-e4f2-4e93-9a5a-939a4270776e/datastream/OBJ/view