Print Email Facebook Twitter In situ TEM and STEM studies of reversible electromigration in thin palladium–platinum bridges Title In situ TEM and STEM studies of reversible electromigration in thin palladium–platinum bridges Author Kozlova, T. Rudneva, M. Zandbergen, H.W. Faculty Applied Sciences Department Quantumnanoscience Date 2013-11-22 Abstract We investigated the reversible electromigration in Pd–Pt nanobridges by means of in situ electron microscopy. Real-time nanometer-scale imaging with scanning transmission electron microscopy was used to determine the material transport. For high current densities (3–5 × 107 A cm?2), material transport occurs from the cathode towards the anode side, indicating a negative effective charge. The electromigration is dominated by atom diffusion at grain boundaries on the free surface. The reversal of material transport upon a change of the electric field direction could be the basis of a memristor. Subject electromigrationin situ transmission electron microscopymass-thickess contrastcritical current density To reference this document use: http://resolver.tudelft.nl/uuid:e0652b32-25bb-440f-b8f9-f4e06b10a148 Publisher IOP Publishing Embargo date 2014-11-22 ISSN 0957-4484 Source Nanotechnology, 24 (50), 2013; Authors version Other version https://doi.org/10.1088/0957-4484/24/50/505708 Part of collection Institutional Repository Document type journal article Rights (c) 2014 The Author(s)IOP Files PDF T.Kozlova_Nanotechnology_24.pdf 504.38 KB Close viewer /islandora/object/uuid:e0652b32-25bb-440f-b8f9-f4e06b10a148/datastream/OBJ/view